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Metrology and Diagnostic Techniques for Nanoelectronics Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma, David G. Seiler

Metrology and Diagnostic Techniques for Nanoelectronics

by Zhiyong Ma, David G. Seiler


ISBN 13: 9789814745086

Format: Hardcover (1454 pages)
Publisher: Jenny Stanford Publishing
Published: 14 Nov 2016

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New : $365.72  
New : $365.72